Abstract
The dislocation free InxAl1-xN nanowires (NWs) are grown on Si(111) by nitrogen plasma assisted molecular beam epitaxy in the temperature regime of 490 degrees C-610 degrees C yielding In composition ranges over 0.50 <= x <= 0.17. We study the optical properties of these NWs by spectroscopic ellipsometry (SE), photoluminescence, and Raman spectroscopies since they possesses minimal strain with reduced defects comparative to the planar films. The optical bandgap measurements of InxAl1-xN NWs are demonstrated by SE where the absorption edges of the NW samples are evaluated irrespective of substrate transparency. A systematic Stoke shift of 0.04-0.27 eV with increasing x was observed when comparing the micro-photoluminescence spectra with the Tauc plot derived from SE. The micro-Raman spectra in the NWs with x = 0.5 showed two-mode behavior for A(1)(LO) phonons and single mode behavior for E-2(H) phonons. As for x = 0.17, i.e., high Al content, we observed a peculiar E-2(H) phonon mode splitting. Further, we observe composition dependent frequency shifts. The 77 to 600K micro-Raman spectroscopy measurements show that both AlN- and InN-like modes of A(1)(LO) and E-2(H) phonons in InxAl1-xN NWs are redshifted with increasing temperature, similar to that of the binary III group nitride semiconductors. These studies of the optical properties of the technologically important InxAl1-xN nanowires will path the way towards lasers and light-emitting diodes in the wavelength of the ultra-violet and visible range. Published by AIP Publishing.