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Beyond the lateral resolution limit by phase imaging
Journal article

Beyond the lateral resolution limit by phase imaging

Y Cotte, MFatih Toy and C Depeursinge
Proceedings of SPIE, the international society for optical engineering, Vol.7904(1), pp.79040S-79040S-6
01/01/2011

Abstract

Apertures Coherence Criteria Imaging Microscopy Nanomaterials Nanostructure Scanning electron microscopy Singularities

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