Abstract
The main aim of this article is to develop an efficient boundary element method (BEM) modeling of the fractional nonlinear generalized photo thermal stress wave propagation problems in the context of functionally graded (FG) anisotropic smart semiconductors. Due to nonlinearity, fractional order heat conduction and strongly anisotropy of mechanical properties, the governing equations system of such problems is often very difficult to solve using classical analytical methods. Therefore, a reliable and efficient coupling scheme based on BEM was proposed to address this challenge, where, the Cartesian transformation method (CTM) has been implemented to calculate the domain integrals, and the generalized modified shift-splitting (GMSS) has been implemented for solving the linear systems arising from BEM. The calculation findings are depicted in graphical forms to display the impacts of temperature-dependent, anisotropy, piezoelectric, graded parameter and fractional parameter on the nonlinear photo thermal stress wave propagation in the considered structure. The numerical findings confirm the consistency and efficacy of the developed modeling methodology.