Sign in
CHARACTERIZATION OF RAPID ELECTRON-BEAM ANNEALED THIN TITANIUM SILICIDE FILMS
Journal article

CHARACTERIZATION OF RAPID ELECTRON-BEAM ANNEALED THIN TITANIUM SILICIDE FILMS

V K Raman, F Mahmood, R A Mcmahon, H Ahmed, C Jeynes, K W Hutt, N Cooper and D J Godfrey
01/03/1988

Metrics

1 Record Views

Details