Abstract
Thin Films of zinc oxide have been deposited by thermal evaporation of zinc metal. The annealing temperature varied from 350 degrees C to 450 degrees C for fixed one hour annealing time. XRD results show the presence of (100), (101) and (002) diffraction peaks for all the films of ZnO. The intensity of the diffraction peaks increase with increase in annealing temperature. The FWHM values of the peaks decrease with increase in annealing temperature showing better crystallinity of the thin films. The SEM study shows the needle like morphology of the thin films. The films are found optically transparent for visible region of the electromagnetic spectrum from the VIS-UV data. RBS study showsthe thickness of films 180nm.