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Calibration of electron spectrometer resolution in attosecond streak camera
Journal article   Open access  Peer reviewed

Calibration of electron spectrometer resolution in attosecond streak camera

Ximao Feng, Steve Gilbertson, Sabih D. Khan, Michael Chini, Yi Wu, Kevin Carnes and Zenghu Chang
Optics express, Vol.18(2), pp.1316-1322
18/01/2010
PMID: 20173958

Abstract

Optics Physical Sciences Science & Technology
We report a new method for determining the energy resolution of time-of-flight spectrometers for detecting photoelectrons produced with attosecond XUV pulses. By measuring the width of the 2s2p autoionization line of helium, we found the resolution of our spectrometer to be similar to 0.6 eV for electrons at 35.5 eV. Furthermore, the resolution in the 10 to 35 eV range was determined by applying a retarding potential at the entrance of the drift tube. (C) 2010 Optical Society of America
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https://doi.org/10.1364/OE.18.001316View
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