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Characterization of (As.Te) 1-x Se x thin films
Journal article   Peer reviewed

Characterization of (As.Te) 1-x Se x thin films

M.M. Hafiz, A.H. Moharram and A.A. Abu-Sehly
Applied physics. A, Materials science & processing, Vol.66(2), pp.217-221
01/02/1998

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