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Characterization of optical and morphological properties of chalcone thin films for optoelectronics applications
Journal article   Peer reviewed

Characterization of optical and morphological properties of chalcone thin films for optoelectronics applications

M.K.M. Ali, A.O Elzupir, M.A. Ibrahem, I.I. Suliman, A. Modwi, Hajo Idriss and K.H. Ibnaouf
Optik (Stuttgart), Vol.145, pp.529-533
01/09/2017

Abstract

Chalcone Crystal structure Optical materials and properties Thin films

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