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Characterization of quaternary chalcogenide As-Ge-Te-Si thin films
Journal article   Peer reviewed

Characterization of quaternary chalcogenide As-Ge-Te-Si thin films

H. H. Amer, M. Elkordy, M. Zien, A. Dahshan and R. A. Elshamy
Optoelectronics and Advanced Materials Rapid Communications (Online), Vol.5(3-4), pp.381-386
01/03/2011

Abstract

Materials Science Materials Science, Multidisciplinary Optics Physical Sciences Science & Technology Technology

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