Abstract
An in-depth study related to a new method of characterizing properties in thermoelectrics is proposed in this paper. This technique is appropriate for single or multi-layered thermoelectric devices. A modulated laser beam is used as a heater in order to generate a Seebeck electromotive force (EMF). The laser beam, line shaped, can be focused at any location along the sample surface, allowing spatially resolved measurements. Seebeck EMF measurements, associated with a versatile model based on the thermal quadrupoles method, allow determination of the sample Seebeck EMF profile and identifying of the sample thermal contact resistances, and should be useful for identification of devices and material thermoelectric properties.