Characterization of wet-etched GaAs (100) surfaces

Journal article

Peer reviewed

M. Rei Vilar, J. El Beghdadi, F. Debontridder, R. Artzi, R. Naaman, A. M. Ferraria and A. M. Botelho do Rego

Surface and interface analysis, Vol.37(8), pp.673-682

08/2005

Abstract

AFM

ATR/MIR

GaAs

HREELS

oxide

wet-etching

XPS

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Title: Characterization of wet-etched GaAs (100) surfaces
Creators - without role: M. Rei Vilar - ITODYS, CNRS-Université Denis Diderot, Paris, France
J. El Beghdadi - Délégation Paris 7
F. Debontridder - Délégation Paris 7
R. Artzi - Weizmann Institute of Science
R. Naaman - Weizmann Institute of Science
A. M. Ferraria - Instituto Politécnico de Lisboa
A. M. Botelho do Rego - CQFM, Instituto Superior Técnico, Lisboa, Portugal
Publication Details: Surface and interface analysis, Vol.37(8), pp.673-682
Publisher: John Wiley & Sons, Ltd
Number of pages: 10
Identifiers: 9935102708331
Academic Unit: King Abdulaziz University
Language: English
Resource Type: Journal article