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Circuit Manufacturing Defect Detection Using VGG16 Convolutional Neural Networks
Journal article   Open access  Peer reviewed

Circuit Manufacturing Defect Detection Using VGG16 Convolutional Neural Networks

Sara A. Althubiti, Fayadh Alenezi, S. Shitharth, Sangeetha K. and Chennareddy Vijay Simha Reddy
Wireless communications and mobile computing, Vol.2022, pp.1-10
01/01/2022

Abstract

url
https://doi.org/10.1155/2022/1070405View
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