Abstract
Coil-shaped structures are proposed to reduce the impact of variable grain alignment on the drive current of the polycrystalline organic thin-film transi-stors (OTFT). Top-gate, bottom-contact polycrystalline OTFT is fabricated with the drop-casted semiconducting layer to verify the proposed structures. The relative standard deviation (RSD) defined as the ratio of standard deviation, and the average of drive current is used for comparing variations between different structures. Coil-shaped transistors have a significantly lower (22%) RSD, compared with the conventional structures (61%). Finally, we present a technique for designing symmetric coil-shaped OTFTs of any arbitrary W/L ratio (>1) with reduced current variation.