Abstract
Combined Rutherford backscattering (RBS), X-ray fluorescence (XRF) and proton induced X-ray emission (PIXE) techniques were used to determine the elemental composition of yeast. Results reveal no toxic elements (e.g. Ag, Pb, etc) in yeast. Yet results display some similarities in concentrations of some elements (e.g. Ti, Mn, Ni, Cu and Sr), large differences are observed for others (e.g. S, Cl, K, Ca, Fe and Zn). Variations are accounted due to different growing media or contamination during processing.