Abstract
Magnesium orthosilicate (Mg2SiO4) was synthesized via a traditional solid-state reaction and a wet chemical route. This study primarily reported the thermoluminescence (TL) behavior of Mg2SiO4 host. X-ray diffraction pattern revealed that Mg2SiO4 exhibits orthorhombic structure matched with JCPDS card 900-6398. Dose response, reproducibility and trap parameters of TL glow curves were evaluated to clearly reveal TL features. Two TL glow peaks situated at 81 °C and 192 °C were monitored at a heating rate of 2 °Cs−1. We observed anomalous heating rate effect for the peak centered at 192 °C whilst TL intensity of the peak at 81 °C decreases with elevating heating rate. Trap depths of the electrons within the trap centers were found to be 1.04 ± 0.01eV and 1.37 ± 0.01eV for both methods using peak shape (PS) method. Distribution of trap centers was examined using the Tmax−Tstop method and this case indicated that the glow curves consist of single TL peaks. The intensity of TL glow curves exhibited a good linear dose response under total area up to 20 Gy. A comparison of the two preparation techniques revealed that TL characteristics of this phosphor are partly dependent and Mg2SiO4 could be a promising material for dosimetric application.
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•Mg2SiO4 phosphors synthesized by a solid-state reaction and wet chemical processes.•TL glow curve recorded under beta excitation.•TL glow curve contains dual peak at 81 °C and 193 °C.•Anomalous heating rate was observed.•Phosphor exhibits dosimetric TL glow peak.