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Comparison of V2O5 Microbolometer Optical Performance Using NiCr and Ti Thin-Films
Journal article

Comparison of V2O5 Microbolometer Optical Performance Using NiCr and Ti Thin-Films

Ehab S. Awad, Najeeb Al-Khalli, Mohamed Abdel-Rahman, Mohammad Alduraibi and Nacer Debbar
IEEE photonics technology letters, Vol.27(5), pp.462-465
01/03/2015

Abstract

Absorption Infrared ellipsometry Infrared optical absorption Metals Microbolometers Optical device fabrication Optical films Optical reflection Optical refraction Optical variables control Thin-film metals

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