Abstract
Thin films of amorphous Se100-xTex with different compositions (x = 10, 20, 30 and 40 at%) were deposited on glass substrates by thermal evaporation. Transmission spectra T(lambda) of the films at normal incidence were obtained in the spectral region from 400 to 2500 nm. A straightforward analysis proposed by Swanepoel [J. Phys. E: Sci. Instrum. 17 896 (1984)], using of the maxima and minima of the interference fringes, was applied to derive the real and imaginary parts of the complex index of refraction plus film thickness. The dispersion of the refractive index is discussed in terms of the single-oscillator Wemple and DiDomenico model [Phys. Rev. B 3 1338 (1971)]. The optical band gap was determined from the spectral dependence of the absorption coefficient using the Tauc formula [in The Optical Properties of Solids, edited by F. Abeles (North Holland, Amsterdam, 1970), p. 227]. The refractive index increases and the optical band gap decreases with increasing tellurium content.