Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ageing tests

M. Tlig; J. Ben Hadj Slama; M. A. Belaid

doi:10.1016/j.microrel.2013.07.111

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Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ageing tests

Journal article

Peer reviewed

Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ageing tests

M. Tlig, J. Ben Hadj Slama and M. A. Belaid

Microelectronics and reliability, Vol.53(9-11), pp.1793-1797

01/09/2013

DOI: https://doi.org/10.1016/j.microrel.2013.07.111

Abstract

Engineering

Engineering, Electrical & Electronic

Nanoscience & Nanotechnology

Physical Sciences

Physics

Physics, Applied

Science & Technology

Science & Technology - Other Topics

Technology

The electromagnetic compatibility (EMC) study is an indispensable step in the power system development cycle components. In this paper, we present a study on the evolution of conducted (in common and differential mode voltages) and radiated interferences generated by a static converter after various accelerated ageing tests (thermal and electrical) of the power switching RF N-LDMOS devices. Experimental results are presented and analyzed. We notice a clear increase in the amplitude of resonances in the interference spectra after ageing tests. (C) 2013 Elsevier Ltd. All rights reserved.

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Title: Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ageing tests
Creators - without role: M. Tlig - University of Sousse
J. Ben Hadj Slama - University of Sousse
M. A. Belaid - University of Sousse
Publication Details: Microelectronics and reliability, Vol.53(9-11), pp.1793-1797
Publisher: Elsevier
Number of pages: 5
Identifiers: 9930906108331
Academic Unit: Umm Al Qura University
Language: English
Resource Type: Journal article