Abstract
We investigated the electrical properties of Mg-doped a-plane Ga1-xInxN (0<x<0.10) films grown on low-dislocation-density-undoped GaN templates on +0.5 degrees-off r-plane sapphire substrates by metalorganic vapor-phase epitaxy. The maximum hole concentration of 8.3 x 10(18) cm(-3) for x = 0.10 was reproducibly achieved at room temperature. The activation energy of Mg acceptors in Mg-doped a-plane Ga0.90In0.10N was as low as 50 meV. (C) 2008 Elsevier B.V. All rights reserved.