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Cross sectional complex structure analysis is a key issue of thin film research: A case study on the preferential orientation crossover in TiN thin films
Journal article   Peer reviewed

Cross sectional complex structure analysis is a key issue of thin film research: A case study on the preferential orientation crossover in TiN thin films

P.B. Barna, D. Biro, M.F. Hasaneen, L. Székely, M. Menyhárd, A. Sulyok, Z.E. Horváth, P. Pekker, I. Dódony and G. Radnóczi
Thin solid films, Vol.688, p.137478
31/10/2019

Abstract

Complex structural characterization Microchemistry Oxygen impurity effect Preferred orientation Preferred orientation cross-over Thin films Titanium nitride

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