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DAPP: automatic detection and analysis of prototype pollution vulnerability in Node.js modules
Journal article   Peer reviewed

DAPP: automatic detection and analysis of prototype pollution vulnerability in Node.js modules

Hee Yeon Kim, Ji Hoon Kim, Ho Kyun Oh, Beom Jin Lee, Si Woo Mun, Jeong Hoon Shin and Kyounggon Kim
International journal of information security, Vol.21(1), pp.1-23
01/02/2022

Abstract

Computer Science Computer Science, Information Systems Computer Science, Software Engineering Computer Science, Theory & Methods Science & Technology Technology

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