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DDR-ESC: A Distributed and Data Reliability Model for Mobile Edge-Based Sensor-Cloud
Journal article   Open access  Peer reviewed

DDR-ESC: A Distributed and Data Reliability Model for Mobile Edge-Based Sensor-Cloud

Khalid Haseeb, Ikram Ud Din, Ahmad Almogren, Zahoor Jan, Naveed Abbas and Muhammad Adnan
IEEE access, Vol.8, pp.185752-185760
01/01/2020

Abstract

Computer Science Computer Science, Information Systems Engineering Engineering, Electrical & Electronic Science & Technology Technology Telecommunications
url
https://doi.org/10.1109/ACCESS.2020.3030192View
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