Sign in
Degradation Mechanisms of Electric Double Layer Capacitors with Activated Carbon Electrodes on High Voltage Exposure
Journal article   Open access  Peer reviewed

Degradation Mechanisms of Electric Double Layer Capacitors with Activated Carbon Electrodes on High Voltage Exposure

Satoshi Muroi, Daisuke Iida, Tomoya Tsuchikawa, Naoaki Yabuuchi, Ron Horikoshi, Nahoko Hosono, Daisuke Komatsu and Shinichi Komaba
Denki kagaku oyobi kōgyō butsuri kagaku, Vol.83(8), pp.609-618
2015

Abstract

Electrochemistry Physical Sciences Science & Technology
url
https://doi.org/10.5796/electrochemistry.83.609View
Published (Version of record) Open

Metrics

1 Record Views

Details