Depth profiling of inhomogeneous zirconia films by optical and Rutherford backscattering spectrometric techniques

Journal article

Peer reviewed

Journal of physics. D, Applied physics, Vol.32(4), pp.388-394

21/02/1999

Abstract

Condensed matter: electronic structure, electrical, magnetic, and optical properties

Exact sciences and technology

Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity

Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation

Optical properties of bulk materials and thin films

Physics

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Title: Depth profiling of inhomogeneous zirconia films by optical and Rutherford backscattering spectrometric techniques
Creators - without role: E. E Khawaja - King Fahd University of Petroleum and Minerals
S. M. A Durrani - King Fahd University of Petroleum and Minerals
M. A Daous - King Fahd University of Petroleum and Minerals
Publication Details: Journal of physics. D, Applied physics, Vol.32(4), pp.388-394
Publisher: Institute of Physics
Identifiers: 9935736208331
Academic Unit: King Abdulaziz University; King Fahd University of Petroleum & Minerals
Language: English
Resource Type: Journal article