Abstract
Electron beam evaporation technique was used to prepare TiO
2 and Ti
2O
3 thin films onto glass substrates of thicknesses 50, 500 and 1000
nm for each sample. The structural investigations revealed that the as-deposited films are amorphous in nature. Transmittance measurements in the wavelength range (350–2000
nm) were used to calculate the refractive index
n and the absorption index
k using Swanepoel's method. The optical constants such as optical band gap
E
g
opt
, optical conductivity
σ
opt, complex dielectric constant, relaxation time
τ and dissipation factor tan
δ were determined. The analysis of the optical absorption data revealed that the optical band gap
E
g was indirect transitions. The optical dispersion parameters
E
o and
E
d were determined according to Wemple and Didomenico method.