Determination of the optical constants of As–Se–Ag chalcogenide thick films with high precision for optoelectronics applications

Journal article

Peer reviewed

E. R. Shaaban, Mohamed N. Abd-el Salam, M. Mohamed, M. A. Abdel-Rahim and A. Y. Abdel-Latief

Journal of materials science. Materials in electronics, Vol.28(18), pp.13379-13390

01/09/2017

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Title: Determination of the optical constants of As–Se–Ag chalcogenide thick films with high precision for optoelectronics applications
Creators - without role: E. R. Shaaban - Al Azhar University
Mohamed N. Abd-el Salam
M. Mohamed - Assiut University
M. A. Abdel-Rahim - Assiut University
A. Y. Abdel-Latief - Assiut University
Publication Details: Journal of materials science. Materials in electronics, Vol.28(18), pp.13379-13390
Identifiers: 9931939108331
Academic Unit: University Ha'il
Language: English
Resource Type: Journal article