Device and Circuit Level Assessment of Negative Capacitance TFETs for Low-Power High-Performance Digital Circuits

Journal article

Peer reviewed

Mohammad Shoaib, S. Intekhab Amin, Naveen Kumar, Sunny Anand, Ankush Chunn and M. Shah Alam

ECS journal of solid state science and technology, Vol.11(5), p.53011

01/05/2022

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Title: Device and Circuit Level Assessment of Negative Capacitance TFETs for Low-Power High-Performance Digital Circuits
Creators - without role: Mohammad Shoaib - Jamia Millia Islamia
S. Intekhab Amin - Jamia Millia Islamia
Naveen Kumar - University of Glasgow
Sunny Anand - Amity University
Ankush Chunn - National Institute of Technology Raipur
M. Shah Alam - Imam Mohammad ibn Saud Islamic University
Publication Details: ECS journal of solid state science and technology, Vol.11(5), p.53011
Publisher: IOP Publishing
Number of pages: 12
Identifiers: 9916029708331
Academic Unit: Imam Mohammad Ibn Saud Islamic University (IMSIU)
Language: English
Resource Type: Journal article