Dielectric property measurement using a resonant nonradiative dielectric waveguide structure

Journal article

Khalid Z Rajab, Kuen-Fwu Fuh, Raj Mittra and Michael Lanagan

IEEE microwave and wireless components letters, Vol.15(2), pp.104-106

01/02/2005

Abstract

Applied sciences

Circuit properties

Electric, optical and optoelectronic circuits

Electronic circuits

Electronics

Exact sciences and technology

Oscillators, resonators, synthetizers

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Title: Dielectric property measurement using a resonant nonradiative dielectric waveguide structure
Creators - without role: Khalid Z Rajab - Pennsylvania State University
Kuen-Fwu Fuh - Industrial Technology Research Institute
Raj Mittra - Pennsylvania State University
Michael Lanagan - Materials Research Institute
Publication Details: IEEE microwave and wireless components letters, Vol.15(2), pp.104-106
Publisher: Institute of Electrical and Electronics Engineers
Identifiers: 9934691708331
Academic Unit: King Abdulaziz University
Language: English
Resource Type: Journal article