Abstract
Bi(2-x)TixO3 (x = 0, 0.01, 0.03. & 0.05) (BO-xT) ceramics are prepared by conventional solid-state route followed by low sintering temperatures. X-ray diffraction analyses show the presence of the monoclinic phase of Bi2O3. The electrical conductivities at room temperature concerning the frequency (ranging from 25 kHz to 5 MHz) and Seebeck Coefficient ranging from 50 degrees C to 400 degrees C were measured. With an increase in Ti (dopant) content, the conductivity and Seebeck Coefficient increased with the temperature increment. The BO-0.03T has the highest Seebeck value (47 mu V/degrees C), which shows a higher carrier concentration. In terms of electrical conductivities, the BO-0.05T ceramic shows the maximum electrical conductivity, i.e. 2.0 x 10(-9) mu S/m as compared to other samples, which exhibit the presence of free electrons. Moreover, relative permittivity (dielectric constant) and dielectric loss are also measured concerning the frequency at room temperature to investigate the dielectric behaviour of the ceramics. This low-temperature sintering ceramics will open new applications in the domain of electronic materials.