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Discriminant analysis and secondary-beam charge recognition
Journal article   Peer reviewed

Discriminant analysis and secondary-beam charge recognition

J. Lukasik, P. Adrich, T. Aumann, C. O. Bacri, T. Barczyk, R. Bassini, S. Bianchin, C. Boiano, A. S. Botvina, A. Boudard, …
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, Vol.587(2-3), pp.413-419
21/03/2008

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Instruments & Instrumentation Nuclear Science & Technology Physical Sciences Physics Physics, Nuclear Physics, Particles & Fields Science & Technology Technology

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