Abstract
•Spray pyrolysis technique is employed to grow CdO.•The XRD is analyzed using modified Williamson–Hall and modified Warren–Averbach methods.•The size parameters, lattice strain, dislocation arrangement parameter, effective outer cut-off radii, dislocation density and size distribution functions are investigated.
Cadmium oxide (CdO) thin films have been successfully deposited on amorphous glass substrates by spray pyrolysis technique at a temperature, 573 °K using aqueous solution of cadmium nitrate 4-Hydrate powder with a concentration of 0.1 M. The X-ray diffraction (XRD) studies have revealed that the films exhibit cubic crystal structure. The modified Williamson–Hall and Warren–Averbach methods are used successfully for analyzing the XRD line profile for determining the crystallite size, dislocation densities and crystallite size distribution in CdO thin films. The crystallite size (D) and integral breadths (d) (D = 44.139 nm and d = 32.237 nm) are obtained by the modified Williamson Hall, while the area-weighted average grain sizes and volume-weighted obtained of modified Warren–Averbach method are xvol=46,06nm andxarea=29,7nm, respectively. The size parameter (Lo), dislocation density (ρ), effective outer cut-off radii (Re) and dislocation arrangement parameter (μ) gotten of Warren–Averbach are 35.53 nm, 2.0 × 1015 m−2, 7 nm and 0.31 nm, respectively. The particle size distribution (x) derived of XRD and estimated of size parameter is the size distribution function f(x) of log-normal.