Abstract
XRD of thermally evaporatedGe(0.15)Te(0.80)Cu(0.05)thin films at higher deposition pressure show amorphous state while the lower deposited films show poly crystalline state. Different preferred orientations were identified; (222), (411) for GeTe4, (101), (003) for Te and (311) for GeTe. The corresponding crystallites sizes are 5,10,11,10 and 9 nm respectively. The lower deposition pressure, LDP develops the optical properties; direct, indirect optical gap and phonon energy are increasing as a function of deposition pressure. Optical gap was affected by carrier concentration. Burstein-Moss effect, B-M effect was used to discuss the variation of the optical properties.