Abstract
Generally, the analysis of a lifetime data to quantify the life characteristics of the product done under normal conditions. The engineers for some reasons may be needed to obtain the reliability results more quickly then, accelerated life tests are applied. In this paper, we adopted partially step-stress accelerated life tests model of product has the generalized half-logistic lifetime distribution. This model is applied on a solar lighting device and the stress factor consider to be temperature. Also, to save the minimum and maximum ideal test time, we applied the generalized type-II hybrid censoring scheme. The parameters of the proposed model are estimated by maximum likelihood and Bayes methods for point and corresponding interval estimators. The validity of results is tested under formulation Monte-Carlo simulation study. The proposed model is applied on analysis data obtained from solar lighting device as real data set for illustrative purposes.