Abstract
Amorphous Se85-x Te15Sb (x) (x = 2.5, 5 and 7.5 at.%) thin films were deposited on glass substrates by thermal evaporation. The absorption coefficient was determined from the transmittance, and reflectance spectra in the wavelength range 400-2500 nm. Various optical constants have been calculated for the studied compositions. The mechanism of the optical absorption follows the rule of non-direct transition. It was found that the optical energy gap, E (g), decreases from 1.42 to 1.36 eV with increasing Sb content from 2.5 to 7.5 at.%. These results can be interpreted on the basis of the chemical bond approach proposed by Bicermo and Ovshinsky. On the other hand, the optical constants such as refractive index, n, and extinction coefficient, K (ex), of the films were studied. The dispersion of the refractive index was discussed in terms of single-oscillator Wemple-DiDomenico model. The influence of Sb content on the structure for the annealed films was investigated using X-ray diffraction (XRD) and scanning electron microscopy. The average particle size of the crystalline size for Te0.04Se0.96 phase deduced from XRD pattern. This average decreases with increasing Sb content.