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Effect of Si3N4 Encapsulation on the Laser-Annealing Behaviour of GaAs
Journal article   Peer reviewed

Effect of Si3N4 Encapsulation on the Laser-Annealing Behaviour of GaAs

M Badawi, J Akintunde, B Sealy and K Stephens
Electronics letters, Vol.15(15), pp.447-448
01/01/1979

Abstract

When semi-insulating GaAs samples are coated with pyrolytically Si3N4 layers and subsequently irradiated with a Q-switched ruby laser with energy densities > 0.3 J/cm2, it is found that a thin layer (0.1-0.25 mu m) of the underlying GaAs substrates becomes n-type. This phenomenon may be the reason why, in previous work on laser annealing of donor implanted GaAs samples, the percentage electrical activity increased when samples were coated with Si3N4.--AA

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