Abstract
Effects of gamma irradiation doses on epoxy resins thin, composed films was investigated. The structure properties of irradiated epoxy resin films with different thickness was measured using X-Ray Diffraction (XRD). Epoxy-resin thin films were exposed to gamma- rays with doses ranging from 0 to 120 kGy. The XRD parameters were calculated in 2 theta (2 θ) range between (4° to 90°). Via the X-ray diffraction analysis, it was found that all physical parameters such as; lattice aspacing (d), inter-chain separation (R), interlayer distance (D), average crystal size (LC), degree of crystallinity (χC), Number of crystallites per unit area (N), dislocation density (δ), micro-strain (ε), average lattice strain (LS), and distortion parameters (g) and total broadening (L) could be determined. The results indicate that all parameters were dependent on (FWHM) and equal to zero, except at 120KGy. The Structure of epoxy thin films was transformed from the amorphous to crystal phase by applying the small thickness thin films and high gamma irradiation doses. Moreover, adding the material hardened in epoxy thin film composites and exposed to gamma irradiation increased crystallinty. The surface morphology was investigated by means of a scanning electron microscope (SEM). Via SEM, the crystal phase morphology is improved and the microstructure is homogenous for different thickness thin films and high gamma irradiation doses. The epoxy resins thin films proved to be an excellent material in different applications requiring low, tensile strength, high elasticity, low wear resistance and moderate thermal resistance especially in manufacture insulators.