Abstract
In this article, a comparative dosimetric study is used on two types of phosphors; the standard LiF (TLD-100) and a home-made LiF : Mg,Cu,P to show that ion beam bombardment may be a useful tool in the study and improvement of radiation sensitive materials. In the bombardment process, either oxygen ion (chemically active) or argon ion (chemically inert) was used, having energy of 4 keV and a flux of 21 × 1013ions cm−2 s−1 and the obtained results were compared with each other. It has been found that the sensitivity of the home-made LiF : Mg,Cu,P has got a maximum of ∼ +40% when pre-treated for 5 min with argon ion beam. Meanwhile the sensitivity for the standard LiF (TLD-100) phosphor has got a maximum of ∼ +20% when pre-treated with oxygen ion for 10 min.