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Effect of thin gold interlayer on the electrical and dielectrical behaviors of ITO/MEH-PPV/Al structures
Journal article   Peer reviewed

Effect of thin gold interlayer on the electrical and dielectrical behaviors of ITO/MEH-PPV/Al structures

O. Dhibi, A. Ltaief, N. Chaaben and A. Bouazizi
Microelectronic engineering, Vol.129(C), pp.24-30
05/11/2014

Abstract

I(V) Interface state density MEH-PPV

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