Effects of copper content and heat treatment on the electrical properties of Ge15Te85-xCux thin films

Journal article

Peer reviewed

M Dongol, M. A Zied, G. A Gamal and A EL-DENGLAWEY

Applied surface science, Vol.161(3-4), pp.365-374

01/07/2000

Abstract

Condensed matter: electronic structure, electrical, magnetic, and optical properties

Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures

Electronic transport phenomena in thin films and low-dimensional structures

Exact sciences and technology

Low-field transport and mobility; piezoresistance

Physics

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Title: Effects of copper content and heat treatment on the electrical properties of Ge15Te85-xCux thin films
Creators - without role: M Dongol - South Valley University
M. A Zied - South Valley University
G. A Gamal - South Valley University
A EL-DENGLAWEY - South Valley University
Publication Details: Applied surface science, Vol.161(3-4), pp.365-374
Publisher: Elsevier Science
Identifiers: 9911768308331
Academic Unit: Taif University
Language: English
Resource Type: Journal article