Abstract
We investigate the effects of the active hold-off technique in single-photon detector (SPD) based on InGaAs/InP avalanche photodiodes (APDs). The concept of this technique is to hold-off an appropriate number of gate pulses after each recorded detection in order to wait for the trapping levels to empty. We found that at almost a 1-MHz repetition rate of the gate, such a hold-off mechanism must block at least two gate pulses after each photon click event to reduce the after-pulsing effect and does not significantly affect the count probability per gate. For higher repetition frequencies, the number of hold-off gates must be increased.