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Electric field-induced hole transport in copper(I) thiocyanate (CuSCN) thin-films processed from solution at room temperature
Journal article   Peer reviewed

Electric field-induced hole transport in copper(I) thiocyanate (CuSCN) thin-films processed from solution at room temperature

Pichaya Pattanasattayavong, Guy Olivier Ngongang Ndjawa, Kui Zhao, Kang Wei Chou, Nir Yaacobi-Gross, Brian C. O'Regan, Aram Amassian and Thomas D. Anthopoulos
Chemical communications (Cambridge, England), Vol.49(39), pp.4154-4156
01/01/2013
PMID: 23223555

Abstract

Chemistry Chemistry, Multidisciplinary Physical Sciences Science & Technology
The optical, structural and charge transport properties of solution-processed films of copper(I) thiocyanate (CuSCN) are investigated in this work. As-processed CuSCN films of similar to 20 nm in thickness are found to be nano-crystalline, highly transparent and exhibit intrinsic hole transporting characteristics with a maximum field-effect mobility in the range of 0.01-0.1 cm(2) V-1 s(-1).

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