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Electrical Characterization of Composition Modulated In1-xSbx Nanowire Field Effect Transistors by Scanning Gate Microscopy
Journal article

Electrical Characterization of Composition Modulated In1-xSbx Nanowire Field Effect Transistors by Scanning Gate Microscopy

A. A. Martinez-Morales, M. Penchev, J. Zhong, X. Jing, K. V. Singh, E. Yengel, M. I. Khan, C. S. Ozkan and M. Ozkan
Journal of nanoscience and nanotechnology, Vol.10(10), pp.6779-6782
01/10/2010
PMID: 21137796

Abstract

Chemistry Chemistry, Multidisciplinary Materials Science Materials Science, Multidisciplinary Nanoscience & Nanotechnology Physical Sciences Physics Physics, Applied Physics, Condensed Matter Science & Technology Science & Technology - Other Topics Technology

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