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Electron impact broadening of Si IV spectral lines: Comparison with recent experiments
Journal article   Peer reviewed

Electron impact broadening of Si IV spectral lines: Comparison with recent experiments

Haykel Elabidi, Nebil Ben Nessib and Sylvie Sahal-Brechot
Journal of quantitative spectroscopy & radiative transfer, Vol.113(12), pp.1606-1611
01/08/2012

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Optics Physical Sciences Science & Technology Spectroscopy Technology

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