Sign in
Electronic transport calculations for rough interfaces in Al, Cu, Ag, and Au
Journal article   Peer reviewed

Electronic transport calculations for rough interfaces in Al, Cu, Ag, and Au

M. M. Fadlallah, C. Schuster, U. Schwingenschloegl, T. Wunderlich and S. Sanvito
Journal of physics. Condensed matter, Vol.21(31), pp.315001-315001 (8)
05/08/2009
PMID: 21828586

Abstract

Physical Sciences Physics Physics, Condensed Matter Science & Technology
We present results of electronic structure and transport calculations for metallic interfaces, based on density functional theory and the non-equilibrium Green's function method. Starting from the electronic structure of smooth Al, Cu, Ag, and Au interfaces, we study the effects of different kinds of interface roughness on the transmission coefficient and the I-V characteristic. In particular, we compare prototypical interface distortions, including vacancies and metallic impurities.

Metrics

1 Record Views

Details