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Electrothermal Finite-Element Modeling for Defect Characterization in Thin-Film Silicon Solar Modules
Journal article   Peer reviewed

Electrothermal Finite-Element Modeling for Defect Characterization in Thin-Film Silicon Solar Modules

Thomas Lanz, Mathias Bonmarin, Michael Stuckelberger, Christian Schlumpf, Christophe Ballif and Beat Ruhstaller
IEEE journal of selected topics in quantum electronics, Vol.19(5), pp.1-8
01/09/2013

Abstract

Engineering Engineering, Electrical & Electronic Optics Physical Sciences Physics Physics, Applied Quantum Science & Technology Science & Technology Technology

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