Abstract
Both operational lifetime and shelf-life of copper phthalocyanine (CuPc) based high frequency Schottky diodes have been studied in this work. Thin films of amorphous Si (a-Si) and polychloro-(para-xylylene) (parylene C) are deposited as a barrier layer using low temperature chemical vapor deposition to improve the lifetime of the CuPc Schottky diodes. The CuPc Schottky diodes encapsulated with the barrier layer exhibit at least 6x longer operational lifetime under both DC and AC voltage stress. Encapsulation does not significantly improve the shelf-life of the organic Schottky diodes. (C) 2013 Elsevier B.V. All rights reserved.