Abstract
We succeeded in growing low-defect-density GaN and Al
0.18Ga
0.82N on a grooved
m-plane GaN by optimizing growth conditions. A reduction in the density of dislocations was confirmed by cross-sectional transmission electron microscopy (TEM).
m-Plane GaN having an atomically flat surface was successfully grown. An improvement in the luminescence intensity of GaN and Al
0.18Ga
0.82N was confirmed by photoluminescence (PL) and cathodoluminescence (CL) measurements.