Abstract
Products or materials under modern technology has a long period of time, and the problem of obtained sufficient information in small period of time need to stress higher than normal conditions. In this article, we address the problem of partially constant-stress accelerated life tests (ALTs) with multiple Type-II censored scheme to estimate exponentiated Weibull (EW) life time distribution. The maximum likelihood and Bayes estimators of the distribution parameters and acceleration factor are developed. Also, the credible and approximate confidence intervals of the parameters are discussed. Although, the Bayes estimators cannot obtained in a plain form, then Markov chain Monte Carlo (MCMC) methods is carried out to draw samples from the posterior distribution. Finally, the estimation procedures are compared and assessed for the unknown parameters inspected over numerical discussions.