Abstract
Genetic variability of quantitative traits and their contribution towards seed yield that may be used as criteria for yield improvement in wheat was investigated. Generation means analysis technique was applied to identify correlation (phenotypic and genetic) coefficients for seven quantitative traits in two wheat crosses and their reciprocals. The estimates of genetic correlation coefficients were found greater than the phenotypic one for all studied plant traits in both crosses and their reciprocals. Seed yield per plant was found positively correlated at phenotypic and genetic levels in cross V-95199 x PARI-73 and it's reciprocal. In this cross, days to heading, peduncle length, spikelets per spike and seed yield per main spike were significantly influenced while harvest index showed negative association with seed yield per plant. The phenotypic and genetic correlation coefficients of cross Chakwal-86 x V-8060 and its reciprocal indicated that seed yield per plant had significantly positive strong association with all studied plant traits except specific flag leaf weight and days to heading. It is concluded that the inter relationship among traits both at phenotypic and genetic levels could efficiently be exploited for obtaining maximum seed yield per main spike, peduncle length, and harvest index which ultimately lead to improve crop yield.