Abstract
Accelerated life tests (ALTs) of highly reliable products or materials are effective testing techniques to gather failure data rapidly in a limited time period. Also, partially accelerated life tests (PALTs) can enable us to achieve this goal without putting all test units under severe conditions. This article considers both frequent and Bayesian estimations of the step-stress PALTs model using time-censored data from generalized exponential distribution (GED). The maximum likelihood and Bayesian estimates of the model parameters are obtained. The posterior means and posterior variances are computed under the squared error (SE) loss function using Lindley’s procedure. The performance of the estimators is evaluated numerically for different parameter values and different sample sizes via their mean squared error (MSE). In addition, the average confidence intervals lengths (ACIL) of the model parameters are also obtained. For illustrative purposes, a simulation study is given.